Get the TRUE performance of your DUT using ccEVM measurement

Get the TRUE Performance of Your DUT Using ccEVM Measurement

A new technique revealed to improve your EVM measurement by up to 5 dB

Measuring the true performance of your device under test (DUT) in wireless and cellular industries requires a test system that can suppress the system noise to get a lower error vector magnitude (EVM) floor, even at higher frequencies and wider bandwidths.

Join Keysight experts in this webinar to learn how our cross-correlated EVM (ccEVM) technique can provide you with the ideal solution for the lowest EVM measurement so you can get the true performance of your DUT.

Available On-demand

Duration: 1 hour

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PRESENTERS

Guo-Quan Lu

R&D Engineer

Keysight Technologies

Parisa Akhshi

Product Marketing Manager

Keysight Technologies