| Important Notice | |
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| 9:10 - 9:40 |
(1) WBG Power Device Applications, Modeling and Measurement Solutions
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| 9:40 - 10:00 |
(2) 4080/B1505A High Voltage Parametric Test Solution
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| 10:00 - 10:20 |
(3) Gate Reliability and Dynamic On-resistance in p-GaN Gate AlGaN/GaN HEMT
- Yue-Ming Hsin, Director, Optical Science Center & Professor, Department of Electrical Engineering, National Central University
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| 10:40 - 11:10 |
(4) Material Measurements for 5G and mmWave Applications
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| 11:10 - 11:40 |
(5) Opto-Electrical Measurements for Integrated Silicon Photonics and SERDES Applications
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| 11:40 - 12:10 |
(6) Silicon Photonics Challenges and Solutions for Wafer Level Tests
- Mr. Dan Rishavy, OSM Market Segment Director of FormFactor
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(7) Automatic to Autonomous – Taking the next step to true hands-free RF Calibrations and Measurements
- Mr. Giancarlo De Chirico, RF Market Segment Director of FormFactor
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| 12:10 - 12:30 |
(8) How to Achieve Trustable RF Calibration and Confident Data When Characterizing Super-fast Interconnects
- Alvin Shao, RF Specialist Senior Application Engineer of MPI Corporation
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| 13:20 - 13:50 |
(9) Innovations of Network Analyzer for Testing Next-Generation RF/mmWave Components
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| 13:50 - 14:20 |
(10) Overcome mmWave Antenna and Multiport Component Test Challenges
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| 14:20 - 14:40 |
(11) 5G FR2 Market and Beamformer IC Update
- Alan Chang, Asia Pacific Sales Director of Anokiwave
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| 14:40 - 15:00 |
(12) AiP Application and Verification Case Study
- Su-Wei Chang, Founder and CEO of TMY Technology Inc.
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| 15:20 - 16:00 |
(13) Ultra Fast and Massive Parametric Testing
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| 16:00 - 16:30 |
(14) 3D Sensing Devices Testing: Overcoming Top 5 LIV Test Challenges
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| 16:30 - 16:40 | Wrap-up and Lucky Draw |
